BibTeX record journals/mr/Bey-TemsamaniKH18

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@article{DBLP:journals/mr/Bey-TemsamaniKH18,
  author       = {Abdellatif Bey{-}Temsamani and
                  S. Kauffmann and
                  Stijn Helsen and
                  T. Gaens and
                  V. Driesen},
  title        = {Physics-of-Failure (PoF) methodology for qualification and lifetime
                  assessment of supercapacitors for industrial applications},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {54--60},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.06.084},
  doi          = {10.1016/J.MICROREL.2018.06.084},
  timestamp    = {Sat, 22 Feb 2020 19:27:36 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Bey-TemsamaniKH18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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