BibTeX record journals/mr/Bey-TemsamaniKD17

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@article{DBLP:journals/mr/Bey-TemsamaniKD17,
  author       = {Abdellatif Bey{-}Temsamani and
                  S. Kauffmann and
                  Y. Descas and
                  Bart Vandevelde and
                  Franco Zanon and
                  Geert Willems},
  title        = {Improved and accurate physics-of-failure (PoF) methodology for qualification
                  and lifetime assessment of electronic systems},
  journal      = {Microelectron. Reliab.},
  volume       = {76-77},
  pages        = {42--46},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.06.047},
  doi          = {10.1016/J.MICROREL.2017.06.047},
  timestamp    = {Sat, 22 Feb 2020 19:27:56 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Bey-TemsamaniKD17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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