Joseph B. Bernstein Moshe Gurfinkel Xiaojun Li Jörg Walters Yoram Shapira Michael Talmor Electronic circuit reliability modeling. 1957-1979 2006 46 Microelectronics Reliability 12 http://dx.doi.org/10.1016/j.microrel.2005.12.004 db/journals/mr/mr46.html#BernsteinGLWST06