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BibTeX record journals/mr/BernsteinGLWST06
@article{DBLP:journals/mr/BernsteinGLWST06, author = {Joseph B. Bernstein and Moshe Gurfinkel and Xiaojun Li and J{\"{o}}rg Walters and Yoram Shapira and Michael Talmor}, title = {Electronic circuit reliability modeling}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {1957--1979}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.12.004}, doi = {10.1016/J.MICROREL.2005.12.004}, timestamp = {Sat, 30 Sep 2023 10:21:31 +0200}, biburl = {https://dblp.org/rec/journals/mr/BernsteinGLWST06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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