BibTeX record journals/mr/BernsteinGLWST06

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@article{DBLP:journals/mr/BernsteinGLWST06,
  author       = {Joseph B. Bernstein and
                  Moshe Gurfinkel and
                  Xiaojun Li and
                  J{\"{o}}rg Walters and
                  Yoram Shapira and
                  Michael Talmor},
  title        = {Electronic circuit reliability modeling},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {1957--1979},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.12.004},
  doi          = {10.1016/J.MICROREL.2005.12.004},
  timestamp    = {Sat, 30 Sep 2023 10:21:31 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/BernsteinGLWST06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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