BibTeX record journals/mr/BerbelFGLBB11

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@article{DBLP:journals/mr/BerbelFGLBB11,
  author       = {N{\'{e}}stor Berbel and
                  Ra{\'{u}}l Fern{\'{a}}ndez{-}Garc{\'{\i}}a and
                  Ignacio Gil and
                  Binhong Li and
                  Alexandre Boyer and
                  Sonia Bendhia},
  title        = {Experimental verification of the usefulness of the nth power law {MOSFET}
                  model under hot carrier wearout},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {9-11},
  pages        = {1564--1567},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2011.06.041},
  doi          = {10.1016/J.MICROREL.2011.06.041},
  timestamp    = {Mon, 20 Nov 2023 16:38:02 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BerbelFGLBB11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}