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BibTeX record journals/mr/BerbelFGLBB11
@article{DBLP:journals/mr/BerbelFGLBB11, author = {N{\'{e}}stor Berbel and Ra{\'{u}}l Fern{\'{a}}ndez{-}Garc{\'{\i}}a and Ignacio Gil and Binhong Li and Alexandre Boyer and Sonia Bendhia}, title = {Experimental verification of the usefulness of the nth power law {MOSFET} model under hot carrier wearout}, journal = {Microelectron. Reliab.}, volume = {51}, number = {9-11}, pages = {1564--1567}, year = {2011}, url = {https://doi.org/10.1016/j.microrel.2011.06.041}, doi = {10.1016/J.MICROREL.2011.06.041}, timestamp = {Mon, 20 Nov 2023 16:38:02 +0100}, biburl = {https://dblp.org/rec/journals/mr/BerbelFGLBB11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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