@article{DBLP:journals/mr/BeaucheneLBPDFPBT03,
  author    = {T. Beauch{\^e}ne and
               Dean Lewis and
               Felix Beaudoin and
               Vincent Pouget and
               Romain Desplats and
               Pascal Fouillat and
               Philippe Perdu and
               M. Bafleur and
               D. Tr{\'e}mouilles},
  title     = {Thermal laser stimulation and NB-OBIC techniques applied
               to ESD defect localization},
  journal   = {Microelectronics Reliability},
  volume    = {43},
  number    = {3},
  year      = {2003},
  pages     = {439-444},
  ee        = {http://dx.doi.org/10.1016/S0026-2714(02)00339-6},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}