@article{DBLP:journals/mr/BarliniCCMF06,
author = {D. Barlini and
Mauro Ciappa and
Alberto Castellazzi and
Michel Mermet-Guyennet and
Wolfgang Fichtner},
title = {New technique for the measurement of the static and of the
transient junction temperature in IGBT devices under operating
conditions},
journal = {Microelectronics Reliability},
volume = {46},
number = {9-11},
year = {2006},
pages = {1772-1777},
ee = {http://dx.doi.org/10.1016/j.microrel.2006.07.058},
bibsource = {DBLP, http://dblp.uni-trier.de}
}