DBLP BibTeX Record 'journals/mr/BarlettaC05'

@article{DBLP:journals/mr/BarlettaC05,
  author    = {Giacomo Barletta and
               Giuseppe Curr{\`o}},
  title     = {Junction leakage current degradation under high temperature
               reverse-bias stress induced by band-defect-band tunnelling
               in power VDMOS},
  journal   = {Microelectronics Reliability},
  volume    = {45},
  number    = {5-6},
  year      = {2005},
  pages     = {994-999},
  ee        = {http://dx.doi.org/10.1016/j.microrel.2004.11.008},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}