BibTeX record: journals/mr/BarlettaC05

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@article{DBLP:journals/mr/BarlettaC05,
  author    = {Giacomo Barletta and
               Giuseppe Curr{\`{o}}},
  title     = {Junction leakage current degradation under high temperature reverse-bias
               stress induced by band-defect-band tunnelling in power {VDMOS}},
  journal   = {Microelectronics Reliability},
  volume    = {45},
  number    = {5-6},
  pages     = {994--999},
  year      = {2005},
  url       = {http://dx.doi.org/10.1016/j.microrel.2004.11.008},
  doi       = {10.1016/j.microrel.2004.11.008},
  timestamp = {Tue, 27 Mar 2007 09:39:09 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/BarlettaC05},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}