DBLP BibTeX Record 'journals/mr/BareisaJMS08'

@article{DBLP:journals/mr/BareisaJMS08,
  author    = {Eduardas Bareisa and
               Vacius Jusas and
               Kestutis Motiejunas and
               Rimantas Seinauskas},
  title     = {Test generation at the algorithm-level for gate-level fault
               coverage},
  journal   = {Microelectronics Reliability},
  volume    = {48},
  number    = {7},
  year      = {2008},
  pages     = {1093-1101},
  ee        = {http://dx.doi.org/10.1016/j.microrel.2008.03.017},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}