BibTeX record: journals/mr/BareisaJMS08

download as .bib file

@article{DBLP:journals/mr/BareisaJMS08,
  author    = {Eduardas Bareisa and
               Vacius Jusas and
               Kestutis Motiejunas and
               Rimantas Seinauskas},
  title     = {Test generation at the algorithm-level for gate-level fault coverage},
  journal   = {Microelectronics Reliability},
  year      = {2008},
  volume    = {48},
  number    = {7},
  pages     = {1093--1101},
  url       = {http://dx.doi.org/10.1016/j.microrel.2008.03.017},
  doi       = {10.1016/j.microrel.2008.03.017},
  timestamp = {Sun, 21 Sep 2014 18:22:37 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/BareisaJMS08},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}