BibTeX record journals/mr/BakerI18

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@article{DBLP:journals/mr/BakerI18,
  author       = {Nick Baker and
                  Francesco Iannuzzo},
  title        = {Smart SiC {MOSFET} accelerated lifetime testing},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {43--47},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.07.067},
  doi          = {10.1016/J.MICROREL.2018.07.067},
  timestamp    = {Sat, 22 Feb 2020 19:28:21 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BakerI18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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