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DBLP BibTeX Record 'journals/mr/AresuKPG07'

@article{DBLP:journals/mr/AresuKPG07,
  author    = {Stefano Aresu and
               Werner Kanert and
               Reinhard Pufall and
               Michael Goroll},
  title     = {Exceptional operative gate voltage induces negative bias
               temperature instability (NBTI) on n-type trench DMOS transistors},
  journal   = {Microelectronics Reliability},
  volume    = {47},
  number    = {9-11},
  year      = {2007},
  pages     = {1416-1418},
  ee        = {http://dx.doi.org/10.1016/j.microrel.2007.07.021},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}