BibTeX record journals/mr/AonoMONMOK05

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@article{DBLP:journals/mr/AonoMONMOK05,
  author       = {Hideki Aono and
                  Eiichi Murakami and
                  Kousuke Okuyama and
                  A. Nishida and
                  Masataka Minami and
                  Y. Ooji and
                  Katsuhiko Kubota},
  title        = {Modeling of {NBTI} saturation effect and its impact on electric field
                  dependence of the lifetime},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {7-8},
  pages        = {1109--1114},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2004.12.015},
  doi          = {10.1016/J.MICROREL.2004.12.015},
  timestamp    = {Sat, 22 Feb 2020 19:29:32 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AonoMONMOK05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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