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BibTeX record journals/mr/AndriesDCCSGLDD02
@article{DBLP:journals/mr/AndriesDCCSGLDD02, author = {E. Andries and R. Dreesen and Kris Croes and Ward De Ceuninck and Luc De Schepper and Guido Groeseneken and K. F. Lo and Marc D'Olieslaeger and Jan D'Haen}, title = {Statistical aspects of the degradation of {LDD} nMOSFETs}, journal = {Microelectron. Reliab.}, volume = {42}, number = {9-11}, pages = {1409--1413}, year = {2002}, url = {https://doi.org/10.1016/S0026-2714(02)00160-9}, doi = {10.1016/S0026-2714(02)00160-9}, timestamp = {Sun, 04 Aug 2024 19:50:26 +0200}, biburl = {https://dblp.org/rec/journals/mr/AndriesDCCSGLDD02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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