DBLP Record 'journals/mr/AltetRBDRCG04'

BibTeX

@article{DBLP:journals/mr/AltetRBDRCG04,
  author    = {Josep Altet and
               J. M. Rampnoux and
               Jean-Christophe Batsale and
               Stefan Dilhaire and
               Antonio Rubio and
               Wilfrid Claeys and
               St{\'e}phane Grauby},
  title     = {Applications of temperature phase measurements to IC testing},
  journal   = {Microelectronics Reliability},
  volume    = {44},
  number    = {1},
  year      = {2004},
  pages     = {95-103},
  ee        = {http://dx.doi.org/10.1016/S0026-2714(03)00138-0},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}