BibTeX record journals/mj/XiaoLJY16

download as .bib file

@article{DBLP:journals/mj/XiaoLJY16,
  author       = {Jie Xiao and
                  William Lee and
                  Jianhui Jiang and
                  Xuhua Yang},
  title        = {Circuit reliability estimation based on an iterative {PTM} model with
                  hybrid coding},
  journal      = {Microelectron. J.},
  volume       = {52},
  pages        = {117--123},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.mejo.2016.03.013},
  doi          = {10.1016/J.MEJO.2016.03.013},
  timestamp    = {Tue, 23 Aug 2022 17:49:47 +0200},
  biburl       = {https://dblp.org/rec/journals/mj/XiaoLJY16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics