Scan flip-flops with on-line testing ability with respect to input delay and crosstalk faults.

Cecilia Metra Stefano Di Francescantonio Michele Favalli Bruno Riccò Scan flip-flops with on-line testing ability with respect to input delay and crosstalk faults. 23-29 2003 34 Microelectronics Journal 1 http://dx.doi.org/10.1016/S0026-2692(02)00125-8 db/journals/mj/mj34.html#MetraFFR03