BibTeX record journals/mj/KushwahaKAKDHC16

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@article{DBLP:journals/mj/KushwahaKAKDHC16,
  author       = {Pragya Kushwaha and
                  K. Bala Krishna and
                  Harshit Agarwal and
                  Sourabh Khandelwal and
                  Juan Pablo Duarte and
                  Chenming Hu and
                  Yogesh Singh Chauhan},
  title        = {Thermal resistance modeling in {FDSOI} transistors with industry standard
                  model {BSIM-IMG}},
  journal      = {Microelectron. J.},
  volume       = {56},
  pages        = {171--176},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.mejo.2016.07.014},
  doi          = {10.1016/J.MEJO.2016.07.014},
  timestamp    = {Sat, 09 Apr 2022 12:32:52 +0200},
  biburl       = {https://dblp.org/rec/journals/mj/KushwahaKAKDHC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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