A new type of quantum wells: stacking faults in silicon carbide.

Hisaomi Iwata Ulf Lindefelt Sven Öberg Patrick R. Briddon A new type of quantum wells: stacking faults in silicon carbide. 371-374 2003 34 Microelectronics Journal 5-8 http://dx.doi.org/10.1016/S0026-2692(03)00027-2 db/journals/mj/mj34.html#IwataLOB03