<?xml version="1.0"?>
<dblp>
<article key="journals/micro/AbellaVUEGT08" mdate="2009-12-10">
<author>Jaume Abella</author>
<author>Xavier Vera</author>
<author>Osman S. Unsal</author>
<author>Oguz Ergin</author>
<author>Antonio Gonz&#225;lez</author>
<author>James W. Tschanz</author>
<title>Refueling: Preventing Wire Degradation due to Electromigration.</title>
<pages>37-46</pages>
<year>2008</year>
<volume>28</volume>
<journal>IEEE Micro</journal>
<number>6</number>
<ee>http://doi.ieeecomputersociety.org/10.1109/MM.2008.92</ee>
<url>db/journals/micro/micro28.html#AbellaVUEGT08</url>
</article>
</dblp>
