BibTeX record journals/mam/KuknerWRKCPLG13

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@article{DBLP:journals/mam/KuknerWRKCPLG13,
  author       = {Halil K{\"{u}}kner and
                  Pieter Weckx and
                  Praveen Raghavan and
                  Ben Kaczer and
                  Francky Catthoor and
                  Liesbet Van der Perre and
                  Rudy Lauwereins and
                  Guido Groeseneken},
  title        = {Impact of duty factor, stress stimuli, gate and drive strength on
                  gate delay degradation with an atomistic trap-based {BTI} model},
  journal      = {Microprocess. Microsystems},
  volume       = {37},
  number       = {8-A},
  pages        = {792--800},
  year         = {2013},
  url          = {https://doi.org/10.1016/j.micpro.2013.04.009},
  doi          = {10.1016/J.MICPRO.2013.04.009},
  timestamp    = {Tue, 29 Dec 2020 18:24:28 +0100},
  biburl       = {https://dblp.org/rec/journals/mam/KuknerWRKCPLG13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}