![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
BibTeX record journals/jssc/YamaokaSMSKSYO05
@article{DBLP:journals/jssc/YamaokaSMSKSYO05, author = {Masanao Yamaoka and Yoshihiro Shinozaki and Noriaki Maeda and Yasuhisa Shimazaki and Kei Kato and Shigeru Shimada and Kazumasa Yanagisawa and Kenichi Osada}, title = {A 300-MHz 25-{\(\mu\)}A/Mb-leakage on-chip {SRAM} module featuring process-variation immunity and low-leakage-active mode for mobile-phone application processor}, journal = {{IEEE} J. Solid State Circuits}, volume = {40}, number = {1}, pages = {186--194}, year = {2005}, url = {https://doi.org/10.1109/JSSC.2004.838014}, doi = {10.1109/JSSC.2004.838014}, timestamp = {Mon, 14 Mar 2022 18:00:22 +0100}, biburl = {https://dblp.org/rec/journals/jssc/YamaokaSMSKSYO05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.