BibTeX record journals/jssc/SylvesterCH98

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@article{DBLP:journals/jssc/SylvesterCH98,
  author       = {Dennis Sylvester and
                  James C. Chen and
                  Chenming Hu},
  title        = {Investigation of interconnect capacitance characterization using charge-based
                  capacitance measurement {(CBCM)} technique and three-dimensional simulation},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {33},
  number       = {3},
  pages        = {449--453},
  year         = {1998},
  url          = {https://doi.org/10.1109/4.661210},
  doi          = {10.1109/4.661210},
  timestamp    = {Tue, 05 Jul 2022 16:10:41 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/SylvesterCH98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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