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@article{DBLP:journals/jssc/SaputraDBILKI08,
  author       = {Nitz Saputra and
                  Mina Danesh and
                  Alessandro Baiano and
                  Ryoichi Ishihara and
                  John R. Long and
                  Nobuo Karaki and
                  Satoshi Inoue},
  title        = {An Assessment of {\(\mathrm{\mu}\)}-Czochralski, Single-Grain Silicon
                  Thin-Film Transistor Technology for Large-Area, Sensor and 3-D Electronic
                  Integration},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {43},
  number       = {7},
  pages        = {1563--1576},
  year         = {2008},
  url          = {https://doi.org/10.1109/JSSC.2008.922404},
  doi          = {10.1109/JSSC.2008.922404},
  timestamp    = {Sun, 30 Aug 2020 00:12:59 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/SaputraDBILKI08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}