BibTeX record journals/jssc/NegreRCSJBGG12

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@article{DBLP:journals/jssc/NegreRCSJBGG12,
  author       = {Laurent Negre and
                  David Roy and
                  Florian Cacho and
                  Patrick Scheer and
                  Sebastien Jan and
                  Samuel Boret and
                  Daniel Gloria and
                  G{\'{e}}rard Ghibaudo},
  title        = {Reliability Characterization and Modeling Solution to Predict Aging
                  of 40-nm {MOSFET} {DC} and {RF} Performances Induced by {RF} Stresses},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {47},
  number       = {5},
  pages        = {1075--1083},
  year         = {2012},
  url          = {https://doi.org/10.1109/JSSC.2012.2185549},
  doi          = {10.1109/JSSC.2012.2185549},
  timestamp    = {Sun, 30 Aug 2020 00:13:20 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/NegreRCSJBGG12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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