<?xml version="1.0"?>
<dblp>
<article key="journals/jssc/ChangYLCCL10" mdate="2012-01-09">
<author>Meng-Fan Chang</author>
<author>Shu-Meng Yang</author>
<author>Chih-Wei Liang</author>
<author>Chih-Chyuang Chiang</author>
<author>Pi-Feng Chiu</author>
<author>Ku-Feng Lin</author>
<title>Noise-Immune Embedded NAND-ROM Using a Dynamic Split Source-Line Scheme for VDDmin and Speed Improvements.</title>
<pages>2142-2155</pages>
<year>2010</year>
<volume>45</volume>
<journal>J. Solid-State Circuits</journal>
<number>10</number>
<ee>http://dx.doi.org/10.1109/JSSC.2010.2060279</ee>
<url>db/journals/jssc/jssc45.html#ChangYLCCL10</url>
</article>
</dblp>
