BibTeX record journals/jssc/ChanC95

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@article{DBLP:journals/jssc/ChanC95,
  author       = {Vei{-}Han Chan and
                  James E. Chung},
  title        = {The impact of {NMOSFET} hot-carrier degradation on {CMOS} analog subcircuit
                  performance},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {30},
  number       = {6},
  pages        = {644--649},
  year         = {1995},
  url          = {https://doi.org/10.1109/4.387067},
  doi          = {10.1109/4.387067},
  timestamp    = {Wed, 03 May 2023 22:43:50 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/ChanC95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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