BibTeX record journals/jsa/HubnerMV92

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@article{DBLP:journals/jsa/HubnerMV92,
  author       = {Uwe H{\"{u}}bner and
                  Wolfgang Meyer and
                  Heinrich Theodor Vierhaus},
  title        = {{CMOS} transistor faults and bridging faults: Testability by delay
                  effects and overcurrents},
  journal      = {Microprocess. Microprogramming},
  volume       = {35},
  number       = {1-5},
  pages        = {377--382},
  year         = {1992},
  url          = {https://doi.org/10.1016/0165-6074(92)90342-5},
  doi          = {10.1016/0165-6074(92)90342-5},
  timestamp    = {Tue, 19 May 2020 15:55:02 +0200},
  biburl       = {https://dblp.org/rec/journals/jsa/HubnerMV92.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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