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BibTeX record journals/jolpe/ZhouXYWC12
@article{DBLP:journals/jolpe/ZhouXYWC12, author = {Bin Zhou and Liyi Xiao and Yizheng Ye and Xin{-}chun Wu and Bei Cao}, title = {Test Pattern Generation Based on Multi-TRC Scan Architecture for Reducing Test Cost}, journal = {J. Low Power Electron.}, volume = {8}, number = {1}, pages = {73--81}, year = {2012}, url = {https://doi.org/10.1166/jolpe.2012.1167}, doi = {10.1166/JOLPE.2012.1167}, timestamp = {Fri, 22 May 2020 13:31:41 +0200}, biburl = {https://dblp.org/rec/journals/jolpe/ZhouXYWC12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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