Low Power Scan Chain Design: A Solution for an Efficient Tradeoff Between Test Power and Scan Routing.

Patrick Girard Yannick Bonhomme Low Power Scan Chain Design: A Solution for an Efficient Tradeoff Between Test Power and Scan Routing. 85-95 2005 1 J. Low Power Electronics 1 http://dx.doi.org/10.1166/jolpe.2005.004 db/journals/jolpe/jolpe1.html#GirardB05