BibTeX record: journals/jolpe/ChenSXB10

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@article{DBLP:journals/jolpe/ChenSXB10,
  author    = {Zhen Chen and
               Sharad C. Seth and
               Dong Xiang and
               Bhargab B. Bhattacharya},
  title     = {{PVT:} Unified Reduction of Test Power, Volume, and Test Time Using
               Double-Tree Scan Architecture},
  journal   = {J. Low Power Electronics},
  year      = {2010},
  volume    = {6},
  number    = {3},
  pages     = {457--468},
  url       = {http://dx.doi.org/10.1166/jolpe.2010.1088},
  doi       = {10.1166/jolpe.2010.1088},
  timestamp = {Sat, 20 Sep 2014 02:04:56 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/jolpe/ChenSXB10},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}