BibTeX record journals/jim/SahnounBBT16

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@article{DBLP:journals/jim/SahnounBBT16,
  author       = {M'hammed Sahnoun and
                  Belgacem Bettayeb and
                  Samuel Bassetto and
                  Michel Tollenaere},
  title        = {Simulation-based optimization of sampling plans to reduce inspections
                  while mastering the risk exposure in semiconductor manufacturing},
  journal      = {J. Intell. Manuf.},
  volume       = {27},
  number       = {6},
  pages        = {1335--1349},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10845-014-0956-x},
  doi          = {10.1007/S10845-014-0956-X},
  timestamp    = {Sun, 12 Nov 2023 02:18:35 +0100},
  biburl       = {https://dblp.org/rec/journals/jim/SahnounBBT16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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