BibTeX record journals/jim/KimLK23

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@article{DBLP:journals/jim/KimLK23,
  author       = {Youngju Kim and
                  Hoyeop Lee and
                  Chang Ouk Kim},
  title        = {A variational autoencoder for a semiconductor fault detection model
                  robust to process drift due to incomplete maintenance},
  journal      = {J. Intell. Manuf.},
  volume       = {34},
  number       = {2},
  pages        = {529--540},
  year         = {2023},
  url          = {https://doi.org/10.1007/s10845-021-01810-2},
  doi          = {10.1007/S10845-021-01810-2},
  timestamp    = {Fri, 10 Feb 2023 23:34:28 +0100},
  biburl       = {https://dblp.org/rec/journals/jim/KimLK23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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