BibTeX record: journals/jcp/LeeKM08

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@article{DBLP:journals/jcp/LeeKM08,
  author    = {{Duk-Hyung} Lee and
               {Dong-Kone} Kwak and
               {Kyeong-Sik} Min},
  title     = {Comparative Study on Leakage Current of Power-Gated SRAMs for 65-nm,
               45-nm, 32-nm Technology Nodes.},
  journal   = {{JCP}},
  year      = {2008},
  volume    = {3},
  number    = {3},
  pages     = {39--47},
  url       = {http://dx.doi.org/10.4304/jcp.3.3.39-47},
  doi       = {10.4304/jcp.3.3.39-47},
  timestamp = {Tue, 02 Sep 2014 22:05:46 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/jcp/LeeKM08},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}