Tijen Ertay Da Ruan Umut Rifat Tuzkaya Integrating data envelopment analysis and analytic hierarchy for the facility layout design in manufacturing systems. 237-262 2006 176 Inf. Sci. 3 http://dx.doi.org/10.1016/j.ins.2004.12.001 db/journals/isci/isci176.html#ErtayRT06