BibTeX record: journals/ipl/NayakRS00

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@article{DBLP:journals/ipl/NayakRS00,
  author    = {Amiya Nayak and
               J. Ren and
               Nicola Santoro},
  title     = {An improved testing scheme for catastrophic fault patterns},
  journal   = {Inf. Process. Lett.},
  year      = {2000},
  volume    = {73},
  number    = {5-6},
  pages     = {199--206},
  url       = {http://dx.doi.org/10.1016/S0020-0190(00)00012-0},
  doi       = {10.1016/S0020-0190(00)00012-0},
  timestamp = {Fri, 19 Sep 2014 02:01:11 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/ipl/NayakRS00},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}