BibTeX record journals/integration/ZhangZLL22

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@article{DBLP:journals/integration/ZhangZLL22,
  author       = {Qing Zhang and
                  Yuhang Zhang and
                  Jizuo Li and
                  Yongfu Li},
  title        = {{WDP-BNN:} Efficient wafer defect pattern classification via binarized
                  neural network},
  journal      = {Integr.},
  volume       = {85},
  pages        = {76--86},
  year         = {2022},
  url          = {https://doi.org/10.1016/j.vlsi.2022.04.003},
  doi          = {10.1016/J.VLSI.2022.04.003},
  timestamp    = {Wed, 31 Jan 2024 20:36:09 +0100},
  biburl       = {https://dblp.org/rec/journals/integration/ZhangZLL22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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