BibTeX record journals/integration/HuangSCCKT16

download as .bib file

@article{DBLP:journals/integration/HuangSCCKT16,
  author       = {Xin Huang and
                  Valeriy Sukharev and
                  Jun{-}Ho Choy and
                  Marko Chew and
                  Taeyoung Kim and
                  Sheldon X.{-}D. Tan},
  title        = {Electromigration assessment for power grid networks considering temperature
                  and thermal stress effects},
  journal      = {Integr.},
  volume       = {55},
  pages        = {307--315},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.vlsi.2016.04.001},
  doi          = {10.1016/J.VLSI.2016.04.001},
  timestamp    = {Thu, 20 Feb 2020 13:21:30 +0100},
  biburl       = {https://dblp.org/rec/journals/integration/HuangSCCKT16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}