Critical Points of Distance to an epsilon-Sampling of a Surface and Flow-Complex-Based Surface Reconstruction.

Tamal K. Dey Joachim Giesen Edgar A. Ramos Bardia Sadri Critical Points of Distance to an epsilon-Sampling of a Surface and Flow-Complex-Based Surface Reconstruction. 29-61 2008 18 Int. J. Comput. Geometry Appl. 1/2 http://dx.doi.org/10.1142/S0218195908002532 db/journals/ijcga/ijcga18.html#DeyGRS08