<?xml version="1.0"?>
<dblp>
<article key="journals/ijces/ZengLZCHHB03" mdate="2004-03-08">
<author>Wenjiang Zeng</author>
<author>Huamao Lin</author>
<author>Xiaolin Zhang</author>
<author>Ramasamy Chockalingam</author>
<author>Wee Chong Heng</author>
<author>Sangki Hong</author>
<author>Narayanan Balasubramanian</author>
<title>Effects Of Wafer Bonding And Thinning Processes On Electrical Performance Of Mos Devices.</title>
<pages>323-326</pages>
<year>2003</year>
<volume>4</volume>
<journal>International Journal of Computational Engineering Science</journal>
<number>2</number>
<ee>http://dx.doi.org/10.1142/S1465876303001186</ee>
<url>db/journals/ijces/ijces4.html#ZengLZCHHB03</url>
</article>
</dblp>
