BibTeX record journals/ijcat/KimLKY10

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@article{DBLP:journals/ijcat/KimLKY10,
  author       = {Hyung Tae Kim and
                  Kang Won Lee and
                  Sung{-}Chul Kim and
                  Hae{-}Jeong Yang},
  title        = {A precise inspection technique for wafer pre-sawing lines using Affine
                  transformation},
  journal      = {Int. J. Comput. Appl. Technol.},
  volume       = {39},
  number       = {1/2/3},
  pages        = {46--52},
  year         = {2010},
  url          = {https://doi.org/10.1504/IJCAT.2010.034729},
  doi          = {10.1504/IJCAT.2010.034729},
  timestamp    = {Thu, 17 Sep 2020 12:04:42 +0200},
  biburl       = {https://dblp.org/rec/journals/ijcat/KimLKY10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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