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BibTeX record journals/iet-cds/MakinoNSMMYIM12
@article{DBLP:journals/iet-cds/MakinoNSMMYIM12, author = {Hiroshi Makino and Shunji Nakata and Hirotsugu Suzuki and Shin'ichiro Mutoh and Masayuki Miyama and Tsutomu Yoshimura and Shuhei Iwade and Yoshio Matsuda}, title = {Utilising the normal distribution of the write noise margin to easily predict the {SRAM} write yield}, journal = {{IET} Circuits Devices Syst.}, volume = {6}, number = {4}, pages = {260--270}, year = {2012}, url = {https://doi.org/10.1049/iet-cds.2012.0090}, doi = {10.1049/IET-CDS.2012.0090}, timestamp = {Thu, 10 Sep 2020 14:36:27 +0200}, biburl = {https://dblp.org/rec/journals/iet-cds/MakinoNSMMYIM12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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