BibTeX record journals/iet-cds/BhardwajWVCV08

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@article{DBLP:journals/iet-cds/BhardwajWVCV08,
  author       = {Sarvesh Bhardwaj and
                  Wenping Wang and
                  Rakesh Vattikonda and
                  Yu Cao and
                  Sarma B. K. Vrudhula},
  title        = {Scalable model for predicting the effect of negative bias temperature
                  instability for reliable design},
  journal      = {{IET} Circuits Devices Syst.},
  volume       = {2},
  number       = {4},
  pages        = {361--371},
  year         = {2008},
  url          = {https://doi.org/10.1049/iet-cds:20070225},
  doi          = {10.1049/IET-CDS:20070225},
  timestamp    = {Thu, 10 Sep 2020 14:36:32 +0200},
  biburl       = {https://dblp.org/rec/journals/iet-cds/BhardwajWVCV08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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