DBLP Record 'journals/ieicet/YuYCF08'

BibTeX

@article{DBLP:journals/ieicet/YuYCF08,
  author    = {Thomas Edison Yu and
               Tomokazu Yoneda and
               Krishnendu Chakrabarty and
               Hideo Fujiwara},
  title     = {Thermal-Aware Test Access Mechanism and Wrapper Design Optimization
               for System-on-Chips},
  journal   = {IEICE Transactions},
  volume    = {91-D},
  number    = {10},
  year      = {2008},
  pages     = {2440-2448},
  ee        = {http://dx.doi.org/10.1093/ietisy/e91-d.10.2440},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}