BibTeX record journals/ieicet/YuYCF08

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@article{DBLP:journals/ieicet/YuYCF08,
  author       = {Thomas Edison Yu and
                  Tomokazu Yoneda and
                  Krishnendu Chakrabarty and
                  Hideo Fujiwara},
  title        = {Thermal-Aware Test Access Mechanism and Wrapper Design Optimization
                  for System-on-Chips},
  journal      = {{IEICE} Trans. Inf. Syst.},
  volume       = {91-D},
  number       = {10},
  pages        = {2440--2448},
  year         = {2008},
  url          = {https://doi.org/10.1093/ietisy/e91-d.10.2440},
  doi          = {10.1093/IETISY/E91-D.10.2440},
  timestamp    = {Mon, 03 Jan 2022 21:56:21 +0100},
  biburl       = {https://dblp.org/rec/journals/ieicet/YuYCF08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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