A Study of Sense-Voltage Margins in Low-Voltage-Operating Embedded DRAM Macros.

Akira Yamazaki Fukashi Morishita Naoya Watanabe Teruhiko Amano Masaru Haraguchi Hideyuki Noda Atsushi Hachisuka Katsumi Dosaka Kazutami Arimoto Setsuo Wake Hideyuki Ozaki Tsutomu Yoshihara A Study of Sense-Voltage Margins in Low-Voltage-Operating Embedded DRAM Macros. 2020-2027 2005 88-C IEICE Transactions 10 http://dx.doi.org/10.1093/ietele/e88-c.10.2020 db/journals/ieicet/ieicet88c.html#YamazakiMWAHNHDAWOY05