A Novel Per-Test Fault Diagnosis Method Based on the Extended <i>X</i>-Fault Model for Deep-Submicron LSI Circuits.

Yuta Yamato Yusuke Nakamura Kohei Miyase Xiaoqing Wen Seiji Kajihara A Novel Per-Test Fault Diagnosis Method Based on the Extended <i>X</i>-Fault Model for Deep-Submicron LSI Circuits. 667-674 2008 91-D IEICE Transactions 3 http://dx.doi.org/10.1093/ietisy/e91-d.3.667 db/journals/ieicet/ieicet91d.html#YamatoNMWK08