YamatoNMWK08'

BibTeX

@article{DBLP:journals/ieicet/YamatoNMWK08,
  author    = {Yuta Yamato and
               Yusuke Nakamura and
               Kohei Miyase and
               Xiaoqing Wen and
               Seiji Kajihara},
  title     = {A Novel Per-Test Fault Diagnosis Method Based on the Extended
               {\it }-Fault Model for Deep-Submicron LSI Circuits},
  journal   = {IEICE Transactions},
  volume    = {91-D},
  number    = {3},
  year      = {2008},
  pages     = {667-674},
  ee        = {http://dx.doi.org/10.1093/ietisy/e91-d.3.667},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}