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BibTeX record journals/ieicet/YamadaSYIKKK10
@article{DBLP:journals/ieicet/YamadaSYIKKK10, author = {Kenta Yamada and Toshiyuki Syo and Hisao Yoshimura and Masaru Ito and Tatsuya Kunikiyo and Toshiki Kanamoto and Shigetaka Kumashiro}, title = {Exhaustive and Systematic Accuracy Verification and Enhancement of {STI} Stress Compact Model for General Realistic Layout Patterns}, journal = {{IEICE} Trans. Electron.}, volume = {93-C}, number = {8}, pages = {1349--1358}, year = {2010}, url = {https://doi.org/10.1587/transele.E93.C.1349}, doi = {10.1587/TRANSELE.E93.C.1349}, timestamp = {Sat, 11 Apr 2020 14:47:54 +0200}, biburl = {https://dblp.org/rec/journals/ieicet/YamadaSYIKKK10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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