DBLP Record 'journals/ieicet/YamadaSANMK08'

BibTeX

@article{DBLP:journals/ieicet/YamadaSANMK08,
  author    = {Kenta Yamada and
               Takashi Sato and
               Shuhei Amakawa and
               Noriaki Nakayama and
               Kazuya Masu and
               Shigetaka Kumashiro},
  title     = {Layout-Aware Compact Model of MOSFET Characteristics Variations
               Induced by STI Stress},
  journal   = {IEICE Transactions},
  volume    = {91-C},
  number    = {7},
  year      = {2008},
  pages     = {1142-1150},
  ee        = {http://dx.doi.org/10.1093/ietele/e91-c.7.1142},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}