A Per-Test Fault Diagnosis Method Based on the <i>X</i>-Fault Model.

Xiaoqing Wen Seiji Kajihara Kohei Miyase Yuta Yamato Kewal K. Saluja Laung-Terng Wang Kozo Kinoshita A Per-Test Fault Diagnosis Method Based on the <i>X</i>-Fault Model. 2756-2765 2006 89-D IEICE Transactions 11 http://dx.doi.org/10.1093/ietisy/e89-d.11.2756 db/journals/ieicet/ieicet89d.html#WenKMYSWK06