BibTeX record journals/ieicet/WenKMYSWK06

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@article{DBLP:journals/ieicet/WenKMYSWK06,
  author       = {Xiaoqing Wen and
                  Seiji Kajihara and
                  Kohei Miyase and
                  Yuta Yamato and
                  Kewal K. Saluja and
                  Laung{-}Terng Wang and
                  Kozo Kinoshita},
  title        = {A Per-Test Fault Diagnosis Method Based on the \emph{X}-Fault Model},
  journal      = {{IEICE} Trans. Inf. Syst.},
  volume       = {89-D},
  number       = {11},
  pages        = {2756--2765},
  year         = {2006},
  url          = {https://doi.org/10.1093/ietisy/e89-d.11.2756},
  doi          = {10.1093/IETISY/E89-D.11.2756},
  timestamp    = {Sat, 11 Apr 2020 15:26:05 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/WenKMYSWK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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